Presenter Full Program · Contributors · Organizations · Search Program · Flagged · Happening NowMore…Search ProgramFlaggedHappening NowSumin OhDankook UniversityPresentationsWork-in-Progress PosterA novel method to analysis the wafer defect patterns using an image matching algorithm based on deep neural networksAIAutonomous SystemsCloudDesignEDAEmbedded SystemsIPSecurity
