Presenter Full Program · Contributors · Organizations · Search Program · Flagged · Happening NowMore…Search ProgramFlaggedHappening NowWeijian FanShenzhen UniversityPresentationsResearch ManuscriptEvery Failure Is A Lesson: Utilizing All Failure Samples To Deliver Tuning-Free Efficient Yield EvaluationEDAPhysical Design and VerificationResearch ManuscriptKATO: Knowledge Alignment And Transfer for Transistor Sizing Of Different Design and TechnologyEDAAnalog CAD, Simulation, Verification and Test