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DTSTAMP:20240626T180034Z
LOCATION:Level 2 Exhibit Hall
DTSTART;TZID=America/Los_Angeles:20240624T170000
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UID:dac_DAC 2024_sess232_ETPOST165@linklings.com
SUMMARY:Achieving High Local Noise Coverage in Dynamic EMIR Analysis using
  SigmaDVD
DESCRIPTION:Engineering Track Poster\n\nGovind Pal (STMicroelectronics) an
 d Amit Jangra and Koshy John (Ansys)\n\nAutomotive-grade multiprocessor Sy
 stem-on-Chips (SoCs) operating in advanced FinFET nodes demand unparallele
 d reliability and quality. Ensuring power integrity signoff for these SoCs
  is crucial, necessitating extensive coverage of local switching noise for
  EMIR analyses. Conventional vectorless EMIR and Gate-VCD based methods ar
 e increasingly inadequate in identifying critical noise conditions affecti
 ng timing. This study introduces a novel aggressor-based EMIR analysis usi
 ng SigmaDVD, delivering exceptional local noise coverage for robust power 
 integrity sign-off. Comparative analyses of conventional vectorless EMIR a
 nd Gate-VCD EMIR against SigmaDVD on two automotive SoCs reveal significan
 tly heightened local noise coverage with SigmaDVD. This innovative approac
 h provides a foundation for confident power integrity signoff on automotiv
 e SoCs, addressing the stringent requirements of extreme reliability in ad
 vanced FinFET nodes.\n\nTopic: Back-End Design, Embedded Systems, Front-En
 d Design, IP
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