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DTSTAMP:20240626T180034Z
LOCATION:Level 2 Exhibit Hall
DTSTART;TZID=America/Los_Angeles:20240625T170000
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UID:dac_DAC 2024_sess233_ETPOST176@linklings.com
SUMMARY:Risk Management in Volume Diagnostics
DESCRIPTION:Engineering Track Poster\n\nPitchumani Guruswamy (Silicon Supp
 ort Solutions (OPC) Private Limited) and Vishnu Raj (Independent)\n\nWafer
  diagnostics plays the key role in enabling yield pull-in by providing cri
 tical data for yield improvement at foundry. The key deliverables are defe
 ct candidate data for failure analysis(FA) and wafer sort analysis. Foundr
 y encounters issues with missing wafer data, delayed data, wrong/partial d
 ata for volume diagnostics. These are due to various factors outside contr
 ol of the diagnostics team and mini eco-system is required to enable the p
 rocessing of wafers provided by foundry and revert back with defect data. 
 Management needs to prioritize the wafers processing on a daily basis whil
 e managing costs. Efficient tools are available and are being built by des
 ign houses. However, they rely upon multiple teams internal and external f
 or their performance. FMEA is the framework that was utilized to provide a
  decision support system for risk management. This paper will discuss the 
 implementation aspects and its benefits. A framework for implementation is
  also provided for ease of use and replication into other design flows.\n\
 nTopic: Back-End Design, Embedded Systems, Front-End Design, IP
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