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UID:dac_DAC 2024_sess256_LBR103@linklings.com
SUMMARY:Late Breaking Results: Efficient Built-in Self-Test for Microfluid
 ic Large-Scale Integration (mLSI)
DESCRIPTION:Late Breaking Results Poster\n\nMengchu Li (Technical Universi
 ty Munich); Hanchen Gu (Swiss Federal Institute of Technology Zurich); Yus
 hen Zhang (Technical University Munich); Siyuan Liang (The Chinese Univers
 ity of Hong Kong); Hudson Gasvoda, Rana Altay, and Emre Araci (Santa Clara
  University); Tsun-Ming Tseng (Technical University Munich); Tsung-Yi Ho (
 The Chinese University of Hong Kong); and Ulf Schlichtmann (Technical Univ
 ersity Munich)\n\nControl channels on microfluidic large-scale integration
  (mLSI) chips are prone to blockage and leakage defects. The state-of-the-
 art test methods suffer efficiency concerns. In this work, we propose a bu
 ilt-in self-test (BIST) method that drastically improves the test efficien
 cy. Given n to-be-tested control channels, we reduced the number of test p
 atterns for blockage and leakage tests from up to n/2 to 1, and from up to
  log2(n+1) to up to log2(X(G)+1), respectively, where X(G) denotes the ver
 tex chromatic number of a graph G consisting of n vertices. We fabricated 
 our design and demonstrated the feasibility and efficiency of our method.
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