Presentation
Ultra-Fast Variation Characterization for Embedded Memories
DescriptionProcess variation library models in the Liberty Variation Format (LVF) have become commonplace in timing signoff for standard cells, yet the embedded memories that comprise most of the chip area still employ library modeling methodologies from several technology generations ago. The main challenge is the greatly increased amount of simulation required to extract meaningful LVF data compared to nominal timing characterization.
It is known that the effect of random process variation is local to a small portion of the circuit. LVF characterization methods based on full-macro or critical-path simulation observe these effects at a global or near-global scale. As a result, they cannot fully utilize the simulation power and causes inefficiency. We believe a good methodology combining strategically partitioning the design and localized OCV models can greatly improve the efficiency of LVF characterization, without compromising accuracy.
This presentation unveils the key technologies behind Liberal-Mem, the memory characterization system from Empyrean, with a highly efficient solution to embedded memory characterization, especially to LVF extraction.
It is known that the effect of random process variation is local to a small portion of the circuit. LVF characterization methods based on full-macro or critical-path simulation observe these effects at a global or near-global scale. As a result, they cannot fully utilize the simulation power and causes inefficiency. We believe a good methodology combining strategically partitioning the design and localized OCV models can greatly improve the efficiency of LVF characterization, without compromising accuracy.
This presentation unveils the key technologies behind Liberal-Mem, the memory characterization system from Empyrean, with a highly efficient solution to embedded memory characterization, especially to LVF extraction.
Event Type
Exhibitor Forum
TimeMonday, June 2411:15am - 11:45am PDT
LocationExhibitor Forum, Level 1 Exhibit Hall