Presenter
Sunghee Lee
Biography
Task Leader, Autonomous Testing,
Solution PE Team, Device Solution Division, Samsung Electronics
2008 - Present
Responsible for verification and testing of solution systems based on non-volatile memory.
Initiated work in NAND defect analysis within the solution system upon joining.
Spearheaded the development of the world's first UFS (Universal Flash Storage) and the design of UFS Test infra's SW/HW architecture and simulation technology.
Currently involved in the development of testing technology for Enterprise SSDs.
Recently, have been focusing efforts on developing test automation technology utilizing Machine Learning techniques.
Solution PE Team, Device Solution Division, Samsung Electronics
2008 - Present
Responsible for verification and testing of solution systems based on non-volatile memory.
Initiated work in NAND defect analysis within the solution system upon joining.
Spearheaded the development of the world's first UFS (Universal Flash Storage) and the design of UFS Test infra's SW/HW architecture and simulation technology.
Currently involved in the development of testing technology for Enterprise SSDs.
Recently, have been focusing efforts on developing test automation technology utilizing Machine Learning techniques.
Presentations
Embedded Systems and Software
AI
Embedded Systems
Engineering Tracks