Presentation
Demystifying Failure Mechanisms at Advanced Nodes
DescriptionSilicon is inherently unreliable, and silicon at advanced nodes is most susceptible. DFX at advanced nodes calls for new strategies. This invited session will explore failure-mechanism driven techniques to enable reliable advanced node silicon. Key topics will include safety, security, reliability and SLM (Silicon Lifecycle Management) methodologies and frameworks that are necessary to ensure reliable silicon.
Event Type
IP
TimeTuesday, June 253:30pm - 5:00pm PDT
Location2012, 2nd Floor
Engineering Tracks
IP