Presentation
NOFIS: Normalizing Flow for Rare Circuit Failure Analysis
DescriptionAccurate estimation of rare failure occurrence probability is crucial for ensuring the proper and reliable functioning of integrated circuits (ICs). Conventional Monte Carlo methods are inefficient, demanding an exorbitant number of samples to achieve reliable estimates. Inspired by the exact sampling capabilities of normalizing flows, we revisit this problem and propose normalizing flow assisted importance sampling, termed NOFIS. NOFIS first learns a sequence of proposal distributions associated with predefined nested subset events by minimizing KL divergence losses. Next, it estimates the rare event probability by utilizing importance sampling in conjunction with the last proposal. The efficacy of our NOFIS method is substantiated through comprehensive qualitative visualizations, affirming the optimality of the learned proposal distribution, as well as 10 quantitative experiments (covering electronic Opamp and Charge Pump circuits, and photonic Y-branch), which highlight NOFIS's superior accuracy over baseline approaches.
Event Type
Research Manuscript
TimeWednesday, June 262:15pm - 2:30pm PDT
Location3008, 3rd Floor
Design
Design for Manufacturability and Reliability