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KATO: Knowledge Alignment And Transfer for Transistor Sizing Of Different Design and Technology
DescriptionAutomatic transistor sizing in circuit design continues to be a formidable challenge. Despite that Bayesian optimization (BO) has achieved significant success, it is circuit-specific, limiting the accumulation and transfer of design knowledge for broader applications. This paper proposes (1) efficient automatic kernel construction, (2) the first transfer learning across different circuits and technology nodes for BO, and (3) a selective transfer learning scheme to ensure only useful knowledge is utilized. These three novel components are integrated into BO with Multi-objective Acquisition Ensemble (MACE) to form Knowledge Alignment and Transfer Optimization (KATO) to deliver state-of-the-art performance: up to 2x simulation reduction and 1.2x design improvement over the baselines.
Event Type
Research Manuscript
TimeThursday, June 2711:45am - 12:00pm PDT
Location3002, 3rd Floor
Topics
EDA
Keywords
Analog CAD, Simulation, Verification and Test