Organization Full Program · Contributors · Organizations · Search Program · Flagged · Happening NowMore…Search ProgramFlaggedHappening NowDankook UniversityContributorsHyunJin KimYoungwook KwonSumin OhJiwon SeoPresentationsWork-in-Progress PosterA novel method to analysis the wafer defect patterns using an image matching algorithm based on deep neural networksAIAutonomous SystemsCloudDesignEDAEmbedded SystemsIPSecurityResearch ManuscriptLook Before You Access: Efficient Heap Memory Safety for Embedded Systems on ARMv8-MSecurityEmbedded and Cross-Layer Security