Session

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Research Manuscript: Advanced in Silicon Lifecycle Management & Test

Session Chair

DescriptionThis session covers a wide range of silicon health challenges and proposes advanced solutions to address them. These include accurate Vmin prediction for better reliability; fault analysis for functional safety; green FPGAs for environmental sustainability; novel ATPG algorithms for neuromorphic chips; improving reliability of AI accelerators; and finally learning-based ATPG for higher quality and yield.

Event TypeResearch Manuscript

TimeTuesday, June 2510:30am - 12:00pm PDT

Location3010, 3rd Floor

Topics

Keywords

Presentations

10:30am - 10:45am PDT	Data-Efficient Conformalized Interval Prediction of Minimum Operating Voltage Capturing Process Variations Authors Yuxuan Yin Rebecca Chen Chen He Peng Li
10:45am - 11:00am PDT	MENDNet: Just-in-time Fault Detection and Mitigation in AI Systems with Uncertainty Quantification and Multi-Exit Networks Authors Shamik Kundu Mirazul Haque Sanjay Das Wei Yang Kanad Basu
11:00am - 11:15am PDT	Low-Complexity Algorithmic Test Generation for Neuromorphic Chips Authors Hsu-Yu Huang Chu-Yun Hsiao Tsung-Te Liu James Li
11:15am - 11:30am PDT	GreenFPGA: Evaluating FPGAs as Environmentally Sustainable Computing Solutions Authors Chetan Choppali Sudarshan Aman Arora Vidya A. Chhabria
11:30am - 11:45am PDT	SmartATPG: A Learning-based Automatic Test Pattern Generation with Graph Convolutional Network and Reinforcement Learning Authors Wenxing Li hongqin Lyu Shengwen Liang Tiancheng Wang Huawei Li
11:45am - 12:00pm PDT	Graph Learning-based Fault Criticality Analysis for Enhancing Functional Safety of E/E Systems Authors Sanjay Das Shamik Kundu Pooja Madhusoodhanan Prasanth Viswanathan Pillai Rubin Parekhji ARNAB RAHA Suvadeep Banerjee Suriya Natarajan Kanad Basu

DAC 2024