Presentation
Methodology of linking the LDR and DRC code by automatically generated test pattern
DescriptionAs for the advancements in the fabrication process, Integrated Circuits (ICs) blocks are complicatedly designed. One of the main verification method verifying the layout using Design Rule Check (DRC) is commonly adopted. DRC is coded by the DRC team understanding the intention of Layout Design Rule (LDR) which is issued by the process engineer. One of the challenges faced between the LDR and DRC is insufficient information. The link between the LDR description and the DRC code is the key factor for preventing accident and turnaround time. Generating LDR based test pattern layout automatically enables to checks intention between DRC code and LDR. For verifying complicated derived layers and cell based test patterns are also needed which requires updating standardized descriptions. Analyzing the result of DRC error from the test pattern strengthens the LDR description and checks the DRC code correctness. We provide solution for standardization, automation flow between the LDR description and DRC code for quality assurance with reduced time.
Event Type
Engineering Track Poster
TimeMonday, June 245:00pm - 6:00pm PDT
LocationLevel 2 Exhibit Hall
Back-End Design
Embedded Systems
Front-End Design
IP