Presentation
Achieving High Local Noise Coverage in Dynamic EMIR Analysis using SigmaDVD
DescriptionAutomotive-grade multiprocessor System-on-Chips (SoCs) operating in advanced FinFET nodes demand unparalleled reliability and quality. Ensuring power integrity signoff for these SoCs is crucial, necessitating extensive coverage of local switching noise for EMIR analyses. Conventional vectorless EMIR and Gate-VCD based methods are increasingly inadequate in identifying critical noise conditions affecting timing. This study introduces a novel aggressor-based EMIR analysis using SigmaDVD, delivering exceptional local noise coverage for robust power integrity sign-off. Comparative analyses of conventional vectorless EMIR and Gate-VCD EMIR against SigmaDVD on two automotive SoCs reveal significantly heightened local noise coverage with SigmaDVD. This innovative approach provides a foundation for confident power integrity signoff on automotive SoCs, addressing the stringent requirements of extreme reliability in advanced FinFET nodes.
Event Type
Engineering Track Poster
TimeMonday, June 245:00pm - 6:00pm PDT
LocationLevel 2 Exhibit Hall
Back-End Design
Embedded Systems
Front-End Design
IP