Presentation
Advanced LLE aware Timing Signoff Methodology
DescriptionThis presentation is about how to consider LLE impact in timing signoff flow. In advanced node, LLE impact is increased than before, so it has become an essential item to be considered.
Because this LLE impact could not be considered in timing signoff flow in the existing method, we introduce the advanced timing signoff methodology that fully considers LLE impact.
LLE impact can be calculated with vth and u0 parameters. So with sensitivity of these parameters characterized library, depending on which cell is placed next to it, the amount of change in these parameters are measured and reflected in the delay.
Additionally, the verification method and design gain that can be obtained from this methodology are also described.
Because this LLE impact could not be considered in timing signoff flow in the existing method, we introduce the advanced timing signoff methodology that fully considers LLE impact.
LLE impact can be calculated with vth and u0 parameters. So with sensitivity of these parameters characterized library, depending on which cell is placed next to it, the amount of change in these parameters are measured and reflected in the delay.
Additionally, the verification method and design gain that can be obtained from this methodology are also described.
Event Type
Engineering Track Poster
TimeMonday, June 245:00pm - 6:00pm PDT
LocationLevel 2 Exhibit Hall
Back-End Design
Embedded Systems
Front-End Design
IP